Hydrolysis of Dimethyl Methylphosphonate (DMMP) in Hot-Compressed Water

Computational study of the adsorption of dimethyl methylphosphonate (DMMP) on the (010) surface of anatase TiO2 with and without faceting

The adsorption of dimethyl methylphosphonate (DMMP) on the (0 1 0) surface of anatase TiO2, which is isostructural with the (1 0 0), has been studied using density functional theory and two-dimensionallyperiodic slab models. The experimentally-observed faceting of this surface has, for the first time, been included in the modeling. The relaxations of bare surfaces both with and without faceting...

Matrix Isolation Infrared Spectroscopic and Theoretical Study of the Interaction of Water with Dimethyl Methylphosphonate

Effect of humidity on the interaction of dimethyl methylphosphonate (DMMP) vapor with SiO2 and Al2O3 surfaces, studied using infrared attenuated total reflection spectroscopy.

Infrared attenuated total reflection spectroscopy has been used to study the interaction of DMMP vapor with SiO(2), Al(2)O(3), and AlO(OH) vs relative humidity (RH) and DMMP partial pressure (P/P(0)). For SiO(2) the growth with increasing RH of ice-like and liquid-like layers is seen in agreement with previous work. H↔D exchange during exposure to H(2)O and D(2)O indicates that the ice-like lay...

Combining hot-compressed water and ball milling pretreatments to improve the efficiency of the enzymatic hydrolysis of eucalyptus

BACKGROUND Lignocellulosic biomass such as wood is an attractive material for fuel ethanol production. Pretreatment technologies that increase the digestibility of cellulose and hemicellulose in the lignocellulosic biomass have a major influence on the cost of the subsequent enzymatic hydrolysis and ethanol fermentation processes. Pretreatments without chemicals such as acids, bases or organic ...

The Effect of Humidity on the Interaction of Dimethyl Methylphosphonate (DMMP) Vapor with SiO2 and Al2O3 Surfaces, Studied Using Infrared Attenuated Total Reflection Spectroscopy

S1. Procedure for determining SiO2 thickness using XPS Figures S1 and S2 show typical XPS data for SiO2 films prepared as described in the main text. The Si 2p data (Fig. S2a) show a peak from the substrate, which is partially resolved into a 2p1/2 and 2p3/2 spin-orbit doublet, and a peak from SiO2, which is too broad to resolve. Other features, due to SiOx (x<2) at the interface, are not readi...